Secure and Dependable Patterns in Organizations: An Empirical Approach.
Posted September 24th, 2009 by troposadmin
Publication Type | Conference Paper | |
Year of Publication | 2007 | |
Authors | Asnar, Y.; Bonato, R.; Giorgini, P.; Massacci, F.; Meduri, V.; Riccucci, C.; Saydane, A. | |
Conference Name | 15th IEEE International Requirements Engineering Conference (RE '07) | |
Conference Start Date | 15/10/2007 | |
Conference Location | New Delhi, India | |
Export | Tagged XML BibTex |
Attachment | Size |
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ASNA-ETAL-07-RE.pdf | 145.02 KB |